TECPS 2017- Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems

Full Citation in the ACM Digital Library


Discovering instructions for robust binary-level coverage criteria

Testing uncertainty of cyber-physical systems in IoT cloud infrastructures: combining model-driven engineering and elastic execution

Fault injection in the internet of things applications

Towards automated composition of heterogeneous tests for cyber-physical systems